Semiconductor Interfaces: Formation and Properties
€145.90
Product Information
| ISBN | 9783642729690 |
|---|---|
| Publisher | Springer-Verlag Berlin and Heidelberg GmbH & Co. KG |
| Price (excl. tax) | €137.64 |
| Tax | €8.26 |
| Price (incl. tax) | €145.90 |
| Availability | Unavailable |
Product Description
(ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure.