Thin Film Analysis by X-Ray Scattering

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Product Information

ISBN9783527310524
PublisherWiley-VCH Verlag GmbH
Price (excl. tax)€192.36
Tax€11.54
Price (incl. tax)€203.90
Availability2 units in external warehouse

Product Description

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films.