Thin Film Analysis by X-Ray Scattering
€ 203,90
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Informação do Produto
| ISBN | 9783527310524 |
|---|---|
| Editora | Wiley-VCH Verlag GmbH |
| Preço (iva excl.) | € 192,36 |
| Imposto | € 11,54 |
| Preço (iva inc.) | € 203,90 |
| Disponibilidade | 2 unidades em armazém externo |
Descrição do Produto
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films.