Fundamentals of Modern VLSI Devices
€ 90,90
Informação do Produto
| ISBN | 9781108480024 |
|---|---|
| Autores | Tak H. Ning, Yuan Taur |
| Editora | Cambridge University Press |
| Formato | Capa dura |
| Número de páginas | 622 |
| Peso (kg) | 1,346 |
| Data de Publicação | 02/12/2021 |
| Preço (iva excl.) | € 85,75 |
| Imposto | € 5,15 |
| Preço (iva inc.) | € 90,90 |
| Disponibilidade | 6 unidades em armazém externo |
Descrição do Produto
A thoroughly updated third edition of an classic and widely adopted text, perfect for practical transistor design and in the classroom. Covering a variety of recent developments, the internationally renowned authors discuss in detail the basic properties and designs of modern VLSI devices, as well as factors affecting performance. Containing around 25% new material, coverage has been expanded to include high-k gate dielectrics, metal gate technology, strained silicon mobility, non-GCA (Gradual Channel Approximation) modelling of MOSFETs, short-channel FinFETS, and symmetric lateral bipolar transistors on SOI. Chapters have been reorganized to integrate the appendices into the main text to enable a smoother learning experience, and numerous additional end-of-chapter homework exercises (+30%) are included to engage students with real-world problems and test their understanding. A perfect text for senior undergraduate and graduate students taking advanced semiconductor devices courses, and for practicing silicon device professionals in the semiconductor industry.